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This article has been retracted by the editor due to significant overlap with a prior publication by the same authors in the proceedings of the 2nd International Conference on Structural Nano Composites under the copyright of the Institute of Physics. JOM policy does not allow for submission for publication of previously published work. The online version of this article contains the full text of the retracted article as electronic supplementary material.
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Merie, V.V., Pustan, M.S., Bîrleanu, C. et al. RETRACTED ARTICLE: Nanocharacterization of Titanium Nitride Thin Films Obtained by Reactive Magnetron Sputtering. JOM 69, 1455 (2017). https://doi.org/10.1007/s11837-015-1460-2
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DOI: https://doi.org/10.1007/s11837-015-1460-2