Orientation Mapping via Precession-Enhanced Electron Diffraction and Its Applications in Materials Science
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- Brons, J.G. & Thompson, G.B. JOM (2014) 66: 165. doi:10.1007/s11837-013-0799-5
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Precession-enhanced diffraction (PED) is a transmission electron microscopy technique that allows for pseudo-kinematical diffraction conditions to occur. Using collected spot patterns, PED has successfully been demonstrated to provide for phase and orientation mapping in a variety of materials. One major advantage of PED is the fine spatial resolution, on the order of a few nanometers, allowing previously inaccessible grain boundary orientation mapping of nanostructured materials to be realized. This article provides a basic overview of the emerging technique with selected highlights of its application to materials science and engineering.