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This comment refers to the invited paper available at: http://dx.doi.org/10.1007/s11749-007-0046-x.
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Shin, Y. Comments on: Panel data analysis—advantages and challenges. TEST 16, 52–55 (2007). https://doi.org/10.1007/s11749-007-0054-x
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DOI: https://doi.org/10.1007/s11749-007-0054-x