Abstract
The effect of vacuum heat treatment on the dielectric properties of PbO-BaO-Na2O-Nb2O5-SiO2 glass-ceramic has been investigated. Results demonstrate that the dielectric constant, dielectric loss, and resistivity remain stable up to 700°C, yet substantial deterioration of the dielectric constant occurred when exceeding 700°C. X-ray diffraction spectra confirm that the deterioration was not due to phase transformation, but could be attributed to oxygen vacancies, as supported by x-ray photoelectron spectroscopy results.
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Acknowledgements
This work was supported by the National Natural Science Foundation of China (No. 51107005 and No. 51477012).
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Zhou, H., Zhang, Q., Tang, Q. et al. Effect of Vacuum Heat Treatment on Dielectric Properties of PbO-BaO-Na2O-Nb2O5-SiO2 Glass-Ceramic. J. Electron. Mater. 44, 3220–3224 (2015). https://doi.org/10.1007/s11664-015-3899-x
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DOI: https://doi.org/10.1007/s11664-015-3899-x