Abstract
Backside-illuminated HgCdTe detectors fabricated on thick CdZnTe substrates have an optical path such that the incident radiation traverses the antireflection (AR) coating layers, the thick CdZnTe substrate, and finally the different layers of the detector. Modeling the spectral response first involves a coherent calculation of the transmission and reflection of a multilayer AR coating on the backside of the CdZnTe substrate. Second, a coherent calculation is made of the reflection and transmission coefficients for the stack of detector materials including wavelength-dependent complex refractive indexes for the detector materials. Third, the transmission and reflection coefficients are then used in an incoherent calculation to account for the multiple reflections in the thick CdZnTe substrate. For the coherent calculations, a stack matrix is constructed from the multiplication of matrices that track the phase and amplitude of the waves propagating across interfaces and from one side of a layer to the other side. These calculations are combined to compute the spectral response and reflectance of the detector as a function of wavelength.
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D’Souza, A.I., Robinson, E., Wijewarnasuriya, P.S. et al. Spectral Response Model of Backside-Illuminated HgCdTe Detectors. J. Electron. Mater. 40, 1657–1662 (2011). https://doi.org/10.1007/s11664-011-1637-6
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DOI: https://doi.org/10.1007/s11664-011-1637-6