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Thermal Expansion of n-Type Doped Bi2Te2.88Se0.12 and p-Type Doped Bi0.52Sb1.48Te3 Solid Solutions from −60°C to +60°C

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Abstract

An automated dilatometric system was developed to measure the thermal expansion of solid materials from −60°C to +400°C. This system was then applied to measure the linear thermal expansions of n-type doped Bi2Te2.88Se0.12 and p-type doped Bi0.52Sb1.48Te3 solid solutions along the a-axis from −60°C to +60°C. The experiments were performed using a vertical “tube/push rod” dilatometer under constant-temperature conditions. The initial alloys were synthesized from Bi, Te, and Se or Sb (each at 99.999 mass% purity) in stoichiometric ratios. The method based on the correlation between the thermal expansion and the heat capacity was proposed to calculate the axial expansion coefficients along the c-axis.

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Authors and Affiliations

  1. Department of Science Materials and Physical Chemistry, Moscow State Technical University of Electronic Technology, Moscow, Russia

    Yu. Stern, L. Pavlova & R. Mironov

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  1. Yu. Stern
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  2. L. Pavlova
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  3. R. Mironov
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Correspondence to R. Mironov.

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Stern, Y., Pavlova, L. & Mironov, R. Thermal Expansion of n-Type Doped Bi2Te2.88Se0.12 and p-Type Doped Bi0.52Sb1.48Te3 Solid Solutions from −60°C to +60°C. J. Electron. Mater. 39, 1422–1428 (2010). https://doi.org/10.1007/s11664-010-1322-1

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  • DOI: https://doi.org/10.1007/s11664-010-1322-1

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