Journal of Electronic Materials

, Volume 37, Issue 9, pp 1356-1361

First online:

Effects of Surface Processing on the Response of CZT Gamma Detectors: Studies with a Collimated Synchrotron X-Ray Beam

  • A. HossainAffiliated withBrookhaven National Laboratory Email author 
  • , A.E. BolotnikovAffiliated withBrookhaven National Laboratory
  • , G.S. CamardaAffiliated withBrookhaven National Laboratory
  • , Y. CuiAffiliated withBrookhaven National Laboratory
  • , S. BabalolaAffiliated withFisk University
  • , A. BurgerAffiliated withFisk University
  • , R.B. JamesAffiliated withBrookhaven National Laboratory

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Using a microscale X-ray mapping technique incorporating a synchrotron beam, we are able to reveal the fine details of the surface properties in cadmium zinc telluride (CZT) semiconductor detectors. A detector, with various degrees of surface roughness, was irradiated by a high-spatial-resolution X-ray beam. The detector’s response was analyzed and displayed as a two-dimensional (2-D) map, and the charge collection was obtained from the peak positions in the spectra versus the beam’s location, which reflects the local material properties. We noted the correlation between the 2-D image and the spectral response of the charge collection at different locations on the surface area, which indicates that a rough surface tends to contain trapping centers, thereby enhancing leakage current and distorting the signal. We also discuss our observations on the transition effect at the boundary area of a rough and a smooth surface under identical conditions.


CZT surface roughness microcharacterization leakage current surface polishing