Journal of Electronic Materials

, Volume 37, Issue 9, pp 1356–1361

Effects of Surface Processing on the Response of CZT Gamma Detectors: Studies with a Collimated Synchrotron X-Ray Beam


    • Brookhaven National Laboratory
  • A.E. Bolotnikov
    • Brookhaven National Laboratory
  • G.S. Camarda
    • Brookhaven National Laboratory
  • Y. Cui
    • Brookhaven National Laboratory
  • S. Babalola
    • Fisk University
  • A. Burger
    • Fisk University
  • R.B. James
    • Brookhaven National Laboratory

DOI: 10.1007/s11664-008-0431-6

Cite this article as:
Hossain, A., Bolotnikov, A., Camarda, G. et al. Journal of Elec Materi (2008) 37: 1356. doi:10.1007/s11664-008-0431-6

Using a microscale X-ray mapping technique incorporating a synchrotron beam, we are able to reveal the fine details of the surface properties in cadmium zinc telluride (CZT) semiconductor detectors. A detector, with various degrees of surface roughness, was irradiated by a high-spatial-resolution X-ray beam. The detector’s response was analyzed and displayed as a two-dimensional (2-D) map, and the charge collection was obtained from the peak positions in the spectra versus the beam’s location, which reflects the local material properties. We noted the correlation between the 2-D image and the spectral response of the charge collection at different locations on the surface area, which indicates that a rough surface tends to contain trapping centers, thereby enhancing leakage current and distorting the signal. We also discuss our observations on the transition effect at the boundary area of a rough and a smooth surface under identical conditions.


CZTsurface roughnessmicrocharacterizationleakage currentsurface polishing

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© TMS 2008