Journal of Electronic Materials

, Volume 36, Issue 8, pp 1092-1097

First online:

Synchrotron X-ray Based Characterization of CdZnTe Crystals

  • Martine C. DuffAffiliated withSavannah River National Laboratory (SRNL) Email author 
  • , Douglas B. HunterAffiliated withSavannah River National Laboratory (SRNL)
  • , Patterson NuessleAffiliated withSavannah River National Laboratory (SRNL)
  • , David R. BlackAffiliated withNational Institute of Standards and Technology (NIST)
  • , Harold BurdetteAffiliated withNational Institute of Standards and Technology (NIST)
  • , Joseph WoicikAffiliated withNational Institute of Standards and Technology (NIST)
  • , Arnold BurgerAffiliated withFisk University
  • , Michael GrozaAffiliated withFisk University

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Synthetic CdZnTe (CZT) crystals can be used for the room temperature-based detection of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases (namely, precipitates and inclusions), can negatively affect detector performance. We used a synchrotron-based x-ray technique, specifically extended x-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission infrared (IR) imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.


IR imaging radiation detectors semiconductors