Journal of Electronic Materials

, Volume 36, Issue 8, pp 1092–1097

Synchrotron X-ray Based Characterization of CdZnTe Crystals

Authors

    • Savannah River National Laboratory (SRNL)
  • Douglas B. Hunter
    • Savannah River National Laboratory (SRNL)
  • Patterson Nuessle
    • Savannah River National Laboratory (SRNL)
  • David R. Black
    • National Institute of Standards and Technology (NIST)
  • Harold Burdette
    • National Institute of Standards and Technology (NIST)
  • Joseph Woicik
    • National Institute of Standards and Technology (NIST)
  • Arnold Burger
    • Fisk University
  • Michael Groza
    • Fisk University
Article

DOI: 10.1007/s11664-007-0181-x

Cite this article as:
Duff, M.C., Hunter, D.B., Nuessle, P. et al. Journal of Elec Materi (2007) 36: 1092. doi:10.1007/s11664-007-0181-x

Abstract

Synthetic CdZnTe (CZT) crystals can be used for the room temperature-based detection of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases (namely, precipitates and inclusions), can negatively affect detector performance. We used a synchrotron-based x-ray technique, specifically extended x-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission infrared (IR) imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.

Keywords

IR imagingradiation detectorssemiconductors
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© TMS 2007