Abstract
Synthetic CdZnTe (CZT) crystals can be used for the room temperature-based detection of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases (namely, precipitates and inclusions), can negatively affect detector performance. We used a synchrotron-based x-ray technique, specifically extended x-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission infrared (IR) imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials.
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Acknowledgements
This work was supported by the National Nuclear Security Administration’s Office of Nonproliferation Research and Engineering (NA-22). Use of the APS was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract no. W-31-109-ENG-38. Use of the NSLS, Brookhaven National Laboratory, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract no. DE-AC02-98CH10886. We acknowledge Dr. Nadia Leyarovska of BESRRC at APS for her excellent assistance at BM-12. The authors at Fisk University gratefully acknowledge financial support from NSF for Center of Research Excellence in Science and Technology (CREST), grant no. 0420516, and from the U.S. Department of Energy Office of Nonproliferation Research and Engineering (NA-22), grant no. DE-FG52-05NA27035.
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Duff, M.C., Hunter, D.B., Nuessle, P. et al. Synchrotron X-ray Based Characterization of CdZnTe Crystals. J. Electron. Mater. 36, 1092–1097 (2007). https://doi.org/10.1007/s11664-007-0181-x
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DOI: https://doi.org/10.1007/s11664-007-0181-x