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Cyclic deformation behavior of high-purity titanium single crystals: Part II. Microstructure and mechanism

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Abstract

Strain-controlled cyclic tests have been conducted on high-purity titanium single crystals with different orientations. The fatigue mechanisms of the titanium crystals were studied by means of a scanning electron microscope (SEM) and a transmission electron microscope (TEM). It was found that single slip lines, wavy slip lines, double slip lines, twins, and associated slip lines occurred in differently oriented single crystals. A new type of fractographic morphology, parallel traces, was observed. Dislocation patterns and cyclic twins, as well as the mechanical response, were analyzed. The dependence of the deformation mechanisms on the orientations of the single crystals is discussed.

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Author notes

  1. X. Tan (Postdoctoral Fellow) & H. Guo (Graduate Student)

    Present address: the Research Institute for Strength of Metals, Xi’an Jiaotong University, 710049, Xi’an, People’s Republic of China

Authors and Affiliations

  1. the Hemispheric Center for Environmental Technology, Florida International University, 33199, Miami, FL

    X. Tan (Postdoctoral Fellow)

  2. the Department of Metallurgy and Materials Engineering, Ecole Polytechnique, Montreal, PQ, Canada

    H. Guo (Graduate Student)

  3. the Research Institute for Strength of Metals, Xi’an Jiaotong University, 710049, Xi’an, People’s Republic of China

    H. Gu (Professor)

  4. the Department of Materials Science and Engineering, University of Pennsylvania, 19104, Philadelphia, PA

    C. Laird (Professor)

  5. the Hemispheric Center for Environmental Technology, Florida International University, USA

    N. D. H. Munroe (Associate Professor)

Authors
  1. X. Tan
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  2. H. Guo
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  3. H. Gu
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  4. C. Laird
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  5. N. D. H. Munroe
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Tan, X., Guo, H., Gu, H. et al. Cyclic deformation behavior of high-purity titanium single crystals: Part II. Microstructure and mechanism. Metall Mater Trans A 29, 513–518 (1998). https://doi.org/10.1007/s11661-998-0132-z

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  • DOI: https://doi.org/10.1007/s11661-998-0132-z

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