Abstract
Photoelectrochemical properties of p-nickel oxide (NiO) thin film deposited on fluorine-doped tin oxide (FTO) electrode, by combination of co-precipitation in aqueous media along with the dip-coating process, were investigated by cyclic voltammetry and chronoamperometry techniques in sodium sulfate (Na2SO4) electrolyte solution. The electrochemical characterization measurements have shown that the FTO/p-NiO electrode presents sensitivity to UV light, as observed by the increased photo-induced current, exposed to a more negative potential. The photoelectrochemical parameters obtained were photocurrent response time (∆t 1), photocurrent decay time (∆t 0), and photocurrent density stability (j ph, j light on − j light off). Besides, this electrode shows excellent performance for methylene blue degradation under UV light irradiation condition, with estimated k obs value of 170 × 10−4 min−1, which is nine times higher than the dark condition and about three times higher than NiO powder catalyst. Results presented here allow concluding that the p-NiO thin film stands as an important electrode material with technological potential to be used directly in environmental preservation.
Similar content being viewed by others
References
Reddy AM, Reddy AS, Lee K-S, Reddy PS (2011) Ceram Int 37:2837–2843
Awais M, Dowling DD, Rahman M, Vos JG, Decker F, Dini D (2013) J Appl Electrochem 43:191–197
Biju V, Khadar MA (2001) Mater Res Bull 36:21–33
Jang W-L, Lu Y-M, Hwang W-S, Chen W-C (2010) J Eur Ceram Soc 30:503–508
Turky AM (2003) Appl Catal A 247:83–93
Swagten HJM, Strijkers GJ, Bloemen PJH, Willekens MMH, Jonge WJM (1996) Phys Rev B 53:9108–9114
Silva MR, Scalvi LVA, Dall’Antonia LH, Santos DI (2013) J Mater Sci Mater Electron 24:1823–1831
Hotovy I, Huran J, Spiess L, Capkovic R, Hascik S (2000) Vacuum 58:300–307
Yu PC, Nazri G, Lambert CM (1987) Sol Energy Mater 16:1–17
Lu H-W, Li D, Sun K, Li Y-S, Fu Z-W (2009) Solid State Sci 11:982–987
Shaigan N, Ivey DG, Chen W (2008) J Electrochem Soc 155:D227
Vidotti M, Torresi RM, Torresi SIC (2010) Quim Nova 33:2176–2186
Svegl F, Vuk AS, Hajzeri M, Perse LS, Orel B (2012) Energy Mater Sol Cells 99:14–25
Irwin MD, Buchholz DB, Hains AW, Chang RPH, Marks TJ (2008) Proc Nat Acad Sci 105:2783–2787
Gao Z-H, Zhang H, Cao G-P, Han M-F, Yang Y-S (2013) Electrochim Acta 87:375–380
Li L, Gibson EA, Qin P, Boschloo G, Gorlov M, Hagfeldt A, Sun L (2010) Adv Mater 22:1759–1762
Nattestad A, Mozer AJ, Fischer MKR, Cheng YB, Mishra A, Bauerle P, Bach U (2010) Nat Mater 9:31–35
Han W, Zhu W, Zhang P, Zhang Y, Li L (2004) Catal Today 90:319–324
Mendez-Martinez AJ, Davila-Jimenez MM, Ornelas-Davila O, Elizalde-Gonzalez MP, Arroyo-Abad U, Sires I, Brillas E (2012) Electrochim Acta 59:140–149
Hayat K, Gondal MA, Khaled MM, Ahmed S (2011) J Mol Catal A Chem 336:64–71
Shu H, Xie J, Xu H, Li H, Gu Z, Sun G, Xu Y (2010) J Alloys Compd 496:633–637
Vera F, Schrebler R, Muñoz E, Suarez C, Cury P, Gómez H, Córdova R, Marotti RE, Dalchiele EA (2005) Thin Solid Films 490:182–188
Qamar M, Gondal MA, Yamani ZH (2011) J Mol Catal A Chem 341:83–88
Zhou B, Qu J, Zhao X, Liu H (2011) J Environ Sci 23:151–159
Silva MR, Dall’Antonia LH, Scalvi LVA, Santos DI, Ruggeiro LO, Urbano A (2012) J Solid State Electrochem 16:2016–2025
Berglund SP, Flaherty DW, Hahn NT, Bard AJ, Mullins CB (2011) J Phys Chem C 115:3794–3802
Lu X, Xie S, Yang H, Tong Y, Ji H (2014) Chem Soc Rev. doi:10.1039/C3CS60392J
Xie S, Zhai T, Li W, Yu M, Liang C, Gan J, Lu X, Tong Y (2013) Green Chem 15:2434–2440
Sato H, Minami T, Takata S, Yamada T (1993) Thin Solid Films 236:27–31
Sharma PK, Fantini MCA, Gorenstein A (1998) Solid State Ionics 457:113–115
Mahmoud SA, Ali SA, Abdel-Rahman M, Abdel-Hady K (2000) Phys B 293:125–131
Kang JK, Rhee SW (2001) Thin Solid Films 391:57–61
Reguig BA, Khelil A, Cattin L, Morsli M, Bernède JC (2007) Appl Surf Sci 253:4330–4334
Zhang Y, Huang X, Lu Z, Liu Z, Ge X, Xu J, Xin X, Sha X, Su W (2006) J Power Sources 160:1217–1220
Deng XY, Chen Z (2004) Mater Lett 58:276–280
Wang S-F, Shi L-Y, Feng X, Ma S-R (2007) Mater Lett 61:1549–1551
Li QY, Wang RN, Nie ZR, Wang ZH, Wei Q (2008) J Colloid Interface Sci 320:254–258
Cullity BD, Stock SR (2001) Elements of X-Ray diffraction. Prentice Hall, New Jersey
Chen HL, Lu YM, Hwang WS (2005) Surf Coat Technol 198:138–142
Jang WL, Lu YM, Hwang WS, Hsiung TL, Wang HP (2008) Surf Coat Technol 202:5444–5447
Purushothaman KK, Muralidharan G (2009) Sol Energy Mater Sol Cells 93:1195–1201
Hakim A, Hossain J, Khan KA (2009) Renew Energy 34:2625–2629
Gupta RK, Ghosh K, Kahol PK (2009) Phys E 41:617–620
Chen X, Zhang Z, Shi C, Li X (2008) Mater Lett 62:346–351
Pejova B, Kocareva T, Najdoski M, Grozdanov I (2000) Appl Surf Sci 165:271–278
Das NS, Saha B, Thapa R, Das GC, Chattopadhyay KK (2010) Phys E 42:1377–1382
Zhu Z, Wei N, Liu H, He Z (2011) Adv Powder Technol 22:422–426
Prathap MUA, Satpati B, Srivastava R (2014) Electrochim Acta 130:368–380
Silva MR, Ângelo ACD, Dall’Antonia LH (2010) Quim Nova 33:2027–2031
Vidotti M, Silva MR, Salvador RP, de Córdoba TSI, Dall’Antonia LH (2008) Electrochim Acta 53:4030–4034
He J, Lindstrom H, Hagfeldt A, Lindquist S-E (1999) J Phys Chem B 103:8940–8943
Silva MR, Lucilha AC, Afonso R, Dall’Antonia LH, Scalvi LVA (2014) Ionics 20:105–113
Hepel M, Luo J (2001) Electrochim Acta 47:729–740
Spyrkowicz L, Radaelli M, Daniele S (2005) Catal Today 100:425–429
Panizza M, Barbucci A, Ricotti R, Cerisola G (2007) Sep Purif Technol 54:382–387
Martínez-Huitle CA, Brillas E (2009) Appl Catal B 87:105–145
Acknowledgments
The authors wish to thank Prof. Margarida J. Saeki for the SEM images. They also acknowledge CNPq, FAPESP, and FUNDAÇÃO ARAUCÁRIA (15585/2010), NEMAN (Pronex, 17378/2009), for financial support.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
da Silva, M.R., Neto, V.S.L., Lucilha, A.C. et al. Photoelectrochemical properties of FTO/p-NiO electrode induced by UV light irradiation. Ionics 21, 1407–1415 (2015). https://doi.org/10.1007/s11581-014-1300-3
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11581-014-1300-3