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Useful lifetime of white OLED under a constant stress accelerated life testing

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Abstract

A constant stress accelerated life testing has been implemented to obtain the useful lifetime of white organic light emitting displays (OLEDs) based on the lognormal distribution. However, other distributions such as Weibull and log-logistic may offer a better fit for failure time data at each stress level. The mean time to failure (MTTF) of a white OLED at each stress level will be estimated by the best fit statistical model. A response model based on an inverse power (exponential) law for all MTTFs under different stress levels is then used to predict the useful lifetime of a white OLED under normal conditions. In addition, the confidence interval of MTTF for a white OLED is provided. The results show that the MTTF of a white OLED is about 15,912 h.

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References

  • Akaike, H.: A new look at the statistical model identification. IEEE Trans. Autom. Control 19(6), 716–723 (1974)

    Article  ADS  MATH  MathSciNet  Google Scholar 

  • Escober, L.A., Meeker, W.Q.: A review of accelerated test models. Stat. Sci. 21(4), 552–577 (2006)

    Article  Google Scholar 

  • Han, L., Narendran, N.: Developing an accelerated life test method for LED drivers. Proc. SPIE 7422, 742209 (2009)

    Article  Google Scholar 

  • Ishizaki, S., Kimura, H., Sugimoto, M.: Lifetime estimation of high power white LEDs. J. Light Vis. Environ. 31(1), 11–18 (2007)

    Article  ADS  Google Scholar 

  • Jeong, J.S., Jung, J.K., Park, S.D.: Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED. Microelectron. Reliab. 48(8–9), 1216–1220 (2008)

    Article  Google Scholar 

  • Kido, J.: Recent progress in organic light-emitting devices. In: Proceedings of the Polymers and Adhesives in Microelectron. Photonics, pp. 18–19 (2007)

  • Levada, S., Meneghini, M., Meneghesso, G.: Analysis of DC current accelerated life tests of GaN LEDs using a Weibull-based statistical model. IEEE Trans. Device Mater. Reliab. 5(4), 688–693 (2005)

    Article  Google Scholar 

  • Mohammadian, S.H., Aït-Kadi, D., Routhier, F.: Quantitative accelerated degradation testing: practical approaches. Reliab. Eng. Syst. Saf. 95(2), 149–159 (2010)

    Article  Google Scholar 

  • Narendran, N., Maliyagoda, N., Bierman, A., Pysar, R., Overington, M.: Characterizing white LEDs for general illumination applications. Proc. SPIE 3938, 137–147 (2000)

    Article  Google Scholar 

  • Nelson, W.: Accelerated Testing: Statistical Models, Test Plan. Wiley, New York (1990)

    Book  Google Scholar 

  • Pan, R., Crispin, T.: A hierarchical modeling approach to accelerated degradation testing data analysis: a case study. Qual. Reliab. Eng. Int. 27(2), 229–237 (2011)

    Article  Google Scholar 

  • R Development Core Team: R: A language and environment for statistical computing. R Foundation for Statistical Computing, Vienna (2013)

  • Schuller, S., Schilinsky, P., Hauch, J., Brabec, C.J.: Determination of the degradation constant of bulk heterojunction solar cells by accelerated lifetime measurements. Appl. Phys. A 79(1), 37–40 (2004)

    Article  ADS  Google Scholar 

  • Shen, H., Pan, J., Feng, H.: Accelerated life test for high-power white LED based on spectroradiometric measurement. Proc. SPIE 6841, 684104 (2007)

    Article  Google Scholar 

  • Wang, F.K., Chu, T.P.: Lifetime predictions of LED-based light bars by accelerated degradation test. Microelectron. Reliab. 52(7), 1332–1336 (2012)

    Article  Google Scholar 

  • Zhang, J., Li, D., Wu, W., Wu, H., Zhu, W.: Lifetime prediction of white OLED based on MLE under lognormal distribution. J. Test. Eval. 41(3), 1–5 (2013)

    Article  Google Scholar 

  • Zhang, J., Liu, F., Liu, Y., Wu, H., Zhu, W., Wu, W., Wu, L.: Life prediction for white OLED based on LSM under lognormal distribution. Solid State Electron. 75, 102–106 (2012a)

    Article  ADS  Google Scholar 

  • Zhang, J., Liu, F., Liu, Y., Wu, H., Wu, W., Zhou, A.: A study of accelerated test of white OLED based on maximum likelihood estimation using lognormal distribution. IEEE Trans. Electron Devices 59(12), 3401–3404 (2012b)

    Article  Google Scholar 

  • Zhang, J., Zhou, T., Wu, H., Liu, Y., Wu, W., Ren, J.: Constant-step-stress accelerated life test of white OLED under Weibull distribution case. IEEE Trans. Electron Devices 59(3), 715–719 (2012c)

    Article  ADS  Google Scholar 

Download references

Acknowledgments

The authors thank the referees for their valuable comments and suggestions to improve the quality of this paper. Also, the authors are grateful for financial support from the National Science Council in Taiwan under the Grant NSC-101-2221-E011-050-MY3.

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  1. Department of Industrial Management, National Taiwan University of Science and Technology, Taipei , 106, Taiwan

    Fu-Kwun Wang & Yi-Chen Lu

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  1. Fu-Kwun Wang
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  2. Yi-Chen Lu
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Correspondence to Fu-Kwun Wang.

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Wang, FK., Lu, YC. Useful lifetime of white OLED under a constant stress accelerated life testing. Opt Quant Electron 47, 323–329 (2015). https://doi.org/10.1007/s11082-014-9915-1

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  • DOI: https://doi.org/10.1007/s11082-014-9915-1

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