, Volume 12, Issue 3, pp 1045-1053
Date: 11 Feb 2010

Three-dimensional characterization of multiply twinned nanoparticles by high-angle tilt series of lattice images and tomography

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Abstract

A new electron tomography methodology is presented which allows the reconstruction of external particle shape from lattice resolved high-resolution electron microscopy images. The technique is based on the shape-from-silhouette binary backprojection algorithm after filtering of the lattice contrast. The simultaneous availability of particle shape and crystallographic lattice plane orientations allows the correlation of faceting with crystallographic orientations. The method is demonstrated using a multiply twinned decahedral gold nanoparticle. Eligibility limits in terms of degree of convexity are derived.