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Enhanced ferroelectric and dielectric properties of BiFeO3–PbTiO3 thin films grown via a sol–gel multilayer deposition method

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Abstract

BiFeO3–PbTiO3 (BF–PT) solid solution thin films were deposited on LaNiO3/SiO2/Si substrates by a sol–gel multilayer deposition method in a super clean room with rapid thermal annealing (RTA) technique. XRD patterns of all the films demonstrate a single perovskite phase. The induced orientation of LaNiO3 substrates leads to highly (100) oriented texture. Cross-section SEM and EDS pictures confirmed that the BFPT-based films are about 230 nm thickness and had formed a dense and uniform solid solution. Film with a ratio of BF:PT = 1:2 (BFPT1-2) possesses best ferroelectric properties. A saturated hysteresis loop with a remnant polarization of 66 μC/cm2 measured at room temperature was obtained, much higher than that of BFPT7030 thin film, which was prepared by depositing BFPT7030 sol directly on LaNiO3/SiO2/Si substrates without multilayer deposition. BFPT1-2 thin films also showed better dielectric and leakage current properties than BFPT7030 thin film in the test range of electric field and frequency. BFPT1-2 thin films exhibit lowest leakage current and loss tangent, indicating that a high quality of BFPT1-2 thin film was successfully prepared by multilayer deposition method with a RTA technique with heating rate of 1 °C/s.

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Acknowledgments

The authors would like to acknowledge the financial support of Scientific Set Sail Project of Southwest Petroleum University (2014QHZ022) and Open Fund of Oil and Gas Material Key Laboratory (x151514kcl03).

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Correspondence to Haimin Li.

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Li, H., Zhu, J., Zhuang, J. et al. Enhanced ferroelectric and dielectric properties of BiFeO3–PbTiO3 thin films grown via a sol–gel multilayer deposition method. J Sol-Gel Sci Technol 75, 353–359 (2015). https://doi.org/10.1007/s10971-015-3706-4

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  • DOI: https://doi.org/10.1007/s10971-015-3706-4

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