Skip to main content
SpringerLink
Log in

Comparison of the influence of titanium and chromium adhesion layers on the properties of sol–gel derived NKN thin films

  • Original Paper
  • Published:
Journal of Sol-Gel Science and Technology Aims and scope Submit manuscript

Abstract

Lead-free (Na0.5K0.5)NbO3 (NKN) thin films were prepared on Pt/X/SiO2/Si substrates (with the adhesion promoters X = Ti, Cr) by a sol–gel process with and without post-annealing treatment. The effect of the diffusion of the adhesion layer elements Ti and Cr into the NKN film was analysed by secondary ion mass spectrometry, scanning electron microscopy pictures, X-ray diffraction (XRD), and leakage current measurements. It turned out that Cr diffuses into the films to a higher extent than Ti. The high amount of Cr diffusion led to the formation of a secondary phase, as seen in the XRD pattern, and to pore formation on the surface of the NKN films. In contrast, the films with Ti adhesion layer were single phase NKN without pore formation. Also, the leakage current measurements showed a strong influence of the Cr diffusion. The leakage current of the films with Cr adhesion layer was about four orders of magnitude higher than that of the films with Ti adhesion layer. The study shows the strong influence of the adhesion layer of the substrate on the properties of NKN films.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5

Similar content being viewed by others

References

  1. Jaffe B, Cook WR, Jaffe JR, Jaffe H (1971) Piezoelectric ceramics. Academic Press, New York

    Google Scholar 

  2. Zang GZ, Wang JF, Chen HC, Su WB, Wang CM, Qi P, Ming BQ, Du J, Zheng LM, Zhang S, Shrout TR (2006) Appl Phys Lett 88:212908

    Article  Google Scholar 

  3. Guo Y, Kakimoto K, Ohsato H (2005) Mater Lett 59:241

    Article  CAS  Google Scholar 

  4. EU-Directive 2002/96/EC, Off J Eur Union 46 [L37] (2003) 24

  5. EU-Directive 2002/95/EC, Off J Eur Union 46 [L37] (2003) 19

  6. Guo Y, Kakimoto K, Ohsato H (2004) Appl Phys Lett 85:4121

    Article  CAS  Google Scholar 

  7. Kizaki Y, Noguchi Y, Miyayama M (2006) Appl Phys Lett 89:142910

    Article  Google Scholar 

  8. Blomqvist M, Koh JH, Khartsev S, Grishin A, Andreasson J (2002) Appl Phys Lett 81:337

    Article  CAS  Google Scholar 

  9. Cho CR, Grishin A (2000) J Appl Phys 87:4439

    Article  CAS  Google Scholar 

  10. Tanaka K, Kakimoto K, Ohsato H (2006) J Cryst Growth 294:209

    Article  CAS  Google Scholar 

  11. Sakamoto W, Mizutani Y, Iizawa N, Yogo T, Hayashi T, Hirano S (2005) J Eur Ceram Soc 25:2305

    Article  CAS  Google Scholar 

  12. Sakamoto W, Mizutani Y, Iizawa N, Yogo T, Hayashi T, Hirano S (2006) J Electroceram 17:293

    Article  CAS  Google Scholar 

  13. Tashiro S, Nagamatzu H, Nagata K (2002) Jpn J Appl Phys 41:7113

    Article  CAS  Google Scholar 

  14. Ahn CW, Jeong ED, Lee SY, Lee HJ, Kang SH, Kim IW (2008) Appl Phys Lett 93:212905

    Article  Google Scholar 

  15. Goh PC, Yao K, Chen Z (2012) J Phys Chem C 116:15550

    Article  CAS  Google Scholar 

  16. Ahn CW, Lee SY, Ullah A, Bae JS, Jeong ED, Choi JS, Park BH, Kim IW (2009) J Phys D Appl Phys 42:215304

    Article  Google Scholar 

  17. Tanaka K, Kakimoto K, Ohsato H, Iijima T (2007) Jpn, J Appl Phys. 46(3A):1094

    Google Scholar 

  18. Goh PC, Yao K (2009) J Am Ceram Soc 92(6): 1322

  19. Dai C-L, Xiao F-Y, Lee C-Y, Cheng Y-C, Chang P-Z, Chang S-H (2004) Mat Sci Eng A 384:57

    Article  Google Scholar 

  20. Wang K, Yao K, Chua SJ (2005) J Appl Phys 98:013538

    Article  Google Scholar 

  21. Wiegand S, Flege S, Baake O, Ensinger W. Bull Mater Sci in print. doi: 10.1007/s12034-012-0367-6

  22. Wiegand S, Flege S, Baake O, Ensinger W (2012) J Mater Sci Technol 28(6):500

    Article  CAS  Google Scholar 

  23. Nakashima Y, Sakamoto W, Shimura T, Yogo T (2007) Jpn J Appl Phys 46:6971

    Article  CAS  Google Scholar 

Download references

Acknowledgments

The authors gratefully acknowledge the LOEWE-Zentrum AdRIA for financial support and Markus Antoni for the assistance with the synthesis.

Author information

Authors and Affiliations

  1. Department of Materials- and Geo-Sciences, Materials Analysis Group, Technische Universität Darmstadt, Petersenstrasse 23, 64287, Darmstadt, Germany

    Sebastian Wiegand, Stefan Flege & Wolfgang Ensinger

Authors
  1. Sebastian Wiegand
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Stefan Flege
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Wolfgang Ensinger
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Sebastian Wiegand.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Wiegand, S., Flege, S. & Ensinger, W. Comparison of the influence of titanium and chromium adhesion layers on the properties of sol–gel derived NKN thin films. J Sol-Gel Sci Technol 67, 654–659 (2013). https://doi.org/10.1007/s10971-013-3125-3

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10971-013-3125-3

Keywords

Search

Navigation