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Development of a PIXE method at high energy with the ARRONAX cyclotron

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Abstract

The high energy PIXE (HEPIXE) method is a multi-elemental non-destructive ion beam analysis technique. It is based on the detection of the X-ray emitted due to the interaction of high energy particle beam with a sample. This technique is fast and allows the analysis of heavy and medium elements in thin (μm), thick (mm) and multilayer samples. At the ARRONAX facility (Nantes, France), the HEPIXE method has been used to determine the composition of natural and synthetic sodalites. Photochromic properties of these samples are supposed to come from the trace elements (concentration in the ppm range) present in the samples. Taking advantage of the 70 MeV proton beam available at our facility, the HEPIXE method has been also used to study multilayer samples. It has been shown that it is possible to determine the composition of each layer, their thicknesses and their depth position by analyzing the recorded X-ray spectra.

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Acknowledgments

The ARRONAX cyclotron is a project promoted by the Regional Council of Pays de la Loire financed by local authorities, the French government and the European Union. This work has been, in part, supported by a grant from the French National Agency for Research called “Investissements d’Avenir”, Equipex Arronax Plus no ANR-11-EQPX-0004. This work has been also supported by the CPER 2007-2013, including funding from the Regional Council of Pays de la Loire, the “Conseil general de Loire-Atlantique”, the French government and the FEDER (European Union). We wish to thank Pr. E. Fritsch (IMN Jean Rouxel) for providing us the sodalites and for fruitful discussions.

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Correspondence to V. Métivier.

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Ragheb, D., Koumeir, C., Métivier, V. et al. Development of a PIXE method at high energy with the ARRONAX cyclotron. J Radioanal Nucl Chem 302, 895–901 (2014). https://doi.org/10.1007/s10967-014-3314-8

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  • DOI: https://doi.org/10.1007/s10967-014-3314-8

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