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Effect of Film Thickness in Electrical Resistivity and Magnetic Properties of Nd0.7Sr0.3MnO3 Thin Films

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Abstract

Nd0.7Sr0.3MnO3 thin films of different thicknesses were deposited on (001)-MgO substrate by using a radio frequency-magnetron sputtering system. These films were divided into two batches and were post-annealed separately in an air and oxygen environment, respectively, at 700 °C. Analysis of X-ray diffraction patterns shows that these films crystallise in cubic structure with a typical lattice constant a = 3.847 Ȧ and it expands with increase in film thickness. Both air- and oxygen-annealed films exhibit ferromagnetic transition and the transition temperature gradually rises as the film thickness is increased. Magnetisation loops recorded at 50 K show that all the prepared thin films show ferromagnetic behaviour with a maximum saturation magnetisation value (3.6 μ B ) comparable to that of bulk sample. The anisotropy constant (K) estimated from the analysis of initial magnetisation curve is found to decrease with increase in film thickness. Metal-insulator transition has been observed and the resistivity data in the insulating region were analysed based on variable range hopping model.

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Acknowledgments

Authors are thankful to CSIR, New Delhi [03(1253)/12/EMR-II], and UGC-DAE-CSR, Mumbai [UDCSR/MUM/CD/CRSM-192], for financial support. CIF, IIT Guwahati is acknowledged for Raman spectroscopy facility.

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  1. Department of Physics, Indian Institute of Technology Guwahati, Guwahati, 781039, India

    T. R. Gopalarao, S. Ravi & D. Pamu

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  1. T. R. Gopalarao
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  2. S. Ravi
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  3. D. Pamu
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Correspondence to S. Ravi.

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Gopalarao, T.R., Ravi, S. & Pamu, D. Effect of Film Thickness in Electrical Resistivity and Magnetic Properties of Nd0.7Sr0.3MnO3 Thin Films. J Supercond Nov Magn 29, 2567–2572 (2016). https://doi.org/10.1007/s10948-016-3563-6

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  • DOI: https://doi.org/10.1007/s10948-016-3563-6

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