Abstract
Gallium (Ga) modified lead zirconate titanate (PbZrTiO3) ceramics with Zr/Ti = 52/48 (i.e., near the morphotropic phase boundary) [i.e., Pb0.94 Ga0.06 (Zr0.48Ti0.52)0.985O3 = PGaZT-6] was fabricated by a mixed-oxide route at high temperatures. Based on determination of basic crystal data using X-ray pattern, single-phase orthorhombic phase of the prepared material obtained. Analysis of the field emission electron scanning microscopy images of the pellet (compacted) sample shows the homogeneous and densely packed grain distribution of varying shapes and size. The dielectric parameters of PGaZT-6 indicate the diffuse phase transition with non-relaxer characteristics of the material. The variation of these dielectric parameters with temperature and frequency of PGaZT-6 follows Jonscher’s universal power law. Thermal (50–500 °C) and electric field (1–1000 kHz) effect on electrical impedance parameters of PGaZT-6 (near MPB) have been analyzed using impedance spectroscopy (IS) technique. Structure-properties of the material has been correlated using this complex technique.
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Sharma, P., Hajra, S., Sahoo, S. et al. Capacitive and resistive characteristics of gallium modified lead zirconate titanate. J Mater Sci: Mater Electron 28, 12048–12055 (2017). https://doi.org/10.1007/s10854-017-7016-1
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DOI: https://doi.org/10.1007/s10854-017-7016-1