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Interdiffusion studies in bulk Au–Ti system

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Abstract

The performance of the contacts, where Au/Ti layers are used in the metallization scheme, largely depends on the product phases grown by interdiffusion at the interface. It is found that four intermetallic compounds grow with narrow homogeneity range and wavy interfaces in the interdiffusion zone. The presence of wavy interfaces is the indication of high anisotropy in diffusion of the product phases. This also reflects in the deviation of parabolic growth from the average. Further, we have determined the relevant diffusion parameters, such as interdiffusion coefficient in the penetrated region of the end members and integrated diffusion coefficients of the intermetallic compounds.

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Acknowledgments

A. Paul would like to acknowledge the financial support received from Department of Science and Technology, Govt. of India (SR/FTP/ETA-18/2006) for this research work.

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  1. Department of Materials Engineering and Centre for Electronics Design and Technology, Indian Institute of Science, Bangalore, 560012, India

    A. K. Kumar & A. Paul

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  1. A. K. Kumar
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  2. A. Paul
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Correspondence to A. Paul.

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Kumar, A.K., Paul, A. Interdiffusion studies in bulk Au–Ti system. J Mater Sci: Mater Electron 21, 1202–1206 (2010). https://doi.org/10.1007/s10854-009-0047-5

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