Abstract
Selective etching of CoFeNiCu/Cu multilayers was investigated with different solutions: HNO3/alcohol, FeCl3/HCl, K2Cr2O7/H2SO4 and dilutions of FeCl3/HCl, K2Cr2O7/H2SO4. Polarization curves on a rotating disk electrode were used to assess the corrosion potential and current density of Cu, and Co-rich alloys. Preferential etching of the Co-rich alloy was attributed to either a less positive corrosion potential or a higher corrosion current density compared to the Cu layer. A dilution of the aqueous K2Cr2O7/H2SO4 solution was considered most promising for submicron structure development.
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This work was supported by the National Science Foundation.
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Huang, Q., Podlaha, E. Selective etching of CoFeNiCu/Cu multilayers. J Appl Electrochem 35, 1127–1132 (2005). https://doi.org/10.1007/s10800-005-9008-8
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DOI: https://doi.org/10.1007/s10800-005-9008-8