Abstract
Fundamental aspects of alternating current Scanning Electrochemical Microscopy (AC-SECM) have been studied. In particular, the flow of AC currents in the cell and simplified equivalent circuit diagrams are discussed. In the case of conductive substrates, the local (1st and 2nd order) impedance characteristic of the substrate is presented as a function of DC potential. 3-D imaging of mixed substrates (containing both conductive and non-conductive areas) was performed in the supporting electrolyte alone, without an added redox mediator.
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The financial support of the Natural Sciences and Engineering Research Council, Canada (NSERC), through an Individual Discovery Grant is gratefully acknowledged.
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Dedicated to Professor Zbigniew Galus on the occasion of his 70th birthday.
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Baranski, A.S., Diakowski, P.M. Application of AC impedance techniques to Scanning Electrochemical Microscopy. J Solid State Electrochem 8, 683–692 (2004). https://doi.org/10.1007/s10008-004-0533-x
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DOI: https://doi.org/10.1007/s10008-004-0533-x