Abstract
Thermal drift in AFM is a significant bottleneck for stability and accuracy of measurements especially for single-molecule mechanics measurements. The authors present design, fabrication and experimental characterization of micromachined sample stages to reduce thermal drift in atomic force microscopy (AFM). The devices are made of titanium and aluminum fabricated on a silicon wafer. The devices thermo-mechanically match commonly used commercially available AFM cantilevers and reduce thermally induced deflection of cantilevers when used as sample stages. An experimental setup is described to characterize steady state and dynamics of the fabricated devices. The experimental data indicates a reduction of 54 % in thermally induced deflection using microstages for a specific cantilever type for force spectroscopy experiments. The results of biomolecular force spectroscopy experiments are presented for biotin/streptavidin molecular pairs. The experiments indicate that the surface of microstages can be functionalized successfully for biomolecular experiments.
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References
Altmann SM, Lenne PF, Heinrich Horber JK (2001) Multiple sensor stabilization system for local probe microscopes. Rev Sci Instrum 72:142–149
Beyder A, Spagnoli C, Sachs F (2006) Reducing probe dependent drift in atomic force microscope with symmetrically supported torsion levers. Rev Sci Instrum 77:056103–056105
Choy JL et al (2007) Differential force microscope for long time-scale biophysical measurements. Rev Sci Instrum 78:043711–043716
Franssila S (2010) Introduction to microfabrication, 2nd edn. Wiley, New York
Kindt JH, Thompson JB, Viani MB, Hansma PK (2002) Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints. Rev Sci Instrum 73:2305–2307
Merkel R, Nassoy P, Leung A, Ritchie K, Evans E (1999) Energy landscapes of receptor–ligand bonds explored with dynamic force spectroscopy. Nature 397:50–53
Mokaberi B, Requicha AA (2006) Drift compensation for automatic nanomanipulation with scanning probe microscopes. Autom Sci Eng IEEE Trans 3:199–207
Schitter G, Stemmer A (2002) Eliminating mechanical perturbations in scanning probe microscopy. Nanotechnology 13:663
Spagnoli C, Beyder A, Besch SR, Sachs F (2007) Drift-free atomic force microscopy measurements of cell height and mechanical properties. Rev sci instrum 78:036111
Sparks A, Manalis S (2006) Atomic force microscopy with inherent disturbance suppression for nanostructure imaging. Nanotechnology 17:1574
Torun H, Finkler O, Degertekin F (2009) Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling. Rev Sci Instrum 80:076103
Weafer P, McGarry J, van Es M, Kilpatrick J, Ronan W, Nolan D, Jarvis S (2012) Stability enhancement of an atomic force microscope for long-term force measurement including cantilever modification for whole cell deformation. Rev Sci Instrum 83:093709–093710
Wenzler L, Moyes G, Beebe T (1996) Improvements to atomic force microscopy cantilevers for increased stability. Rev Sci Instrum 67:4191–4197
Yuan C, Chen A, Kolb P, Moy VT (2000) Energy landscape of streptavidin-biotin complexes measured by atomic force microscopy. Biochemistry 39:10219–10223
Acknowledgments
This work was funded by EC-FP7 Marie Curie Actions, IRG, Project Number 276937. Authors would like to thank Ms. Sinem Ulus for help with experimental setup.
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Sevim, S., Tolunay, S. & Torun, H. Micromachined sample stages to reduce thermal drift in atomic force microscopy. Microsyst Technol 21, 1559–1566 (2015). https://doi.org/10.1007/s00542-014-2251-3
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DOI: https://doi.org/10.1007/s00542-014-2251-3