Abstract
A high-numerical-aperture (NA) optical system with narrower recording distance in transverse direction is required to increase the areal-density in micro holographic storage. When the first data is recorded by shift misalignment of the two objective lenses (OLs) in transverse direction, the second data can cause inter-symbol-interference (ISI) by pre-recorded first data. A tolerance analysis in transverse direction is required because shift misalignment of the two OLs causes ISI and reduces the total-density. This research analyzes the effects of ISI using a 0.85 NA and 320 nm recording distance between two microgratings in adjacent region. We define the recording tolerance of a single micrograting and the calculate total-density based on blu-ray disc specifications while considering the shift errors. Finally, we define the recording tolerance of successively recorded microgratings in adjacent region and propose recording distance for avoiding ISI.
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Acknowledgments
This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2011-0027349).
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Paper presented at the 21st annual symposium on information storage and processing systems, Santa Clara, CA, USA, 13–14 June 2011.
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Min, CK., Kim, DH., Jeon, S. et al. Analysis of inter-symbol-interference caused by shift misalignment of two objective lenses in high-NA micro holographic storage. Microsyst Technol 18, 1623–1631 (2012). https://doi.org/10.1007/s00542-012-1600-3
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DOI: https://doi.org/10.1007/s00542-012-1600-3