Abstract
We demonstrate the effectiveness of silicon phase masks to implement spatially resolved, multispectral imaging capabilities in the range of terahertz frequencies, using a standard setup of basic interest for time-domain spectrometry with a single-cell source and a single-cell detector. Our principle primarily aims at the development of robust and inexpensive systems. It consists of appropriate space-to-time encoding, in order to ensure single-scan triggering and then take advantage of rapid and self-consistent measurements in the two-dimensional space. The process enables very efficient discrimination giving access to a relevant spatial resolution in the analysis of small size, planar assemblies made of inhomogeneous materials. Benchmark results are provided to validate the concept, thanks to prototyping phase masks with 2 × 2 pixels, prior evidencing actual performance limitations in the case of 3 × 3 pixels. Due to the frequency bandwidth of 0.1–1.5 THz in our setup and to the available operating conditions, currently acceptable pixel resolutions lie in the range of 3–4 mm. Numerical modeling by means of finite elements helps to discuss these numbers and to investigate the relevant theoretical issues, figuring the main propagation issues in connection with a sub-picosecond seed pulse throughout various masks. This involves diffraction and trailing edge effects when crossing the mask together with residual, parasitic reflections. Finally, we give a consistent prospective for improved performance, via realistic updates regarding the architecture of the setup and complementary post-processing. Further values for the attainable spatial resolution then range from 5 × 5 to 6 × 6 pixels.
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Acknowledgments
The financial support of the Conseil Régional d’Aquitaine is greatly acknowledged. This work was completed within the frame of the cluster Route des Lasers. The authors declare that they have no conflict of interest.
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Jolly, A., Gokhan, F.S., Jolly, JC. et al. Combination of silicon phase masks with time-domain spectroscopy for single-scan terahertz imaging. Appl. Phys. B 120, 441–450 (2015). https://doi.org/10.1007/s00340-015-6153-6
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DOI: https://doi.org/10.1007/s00340-015-6153-6