Design and fabrication of highly dispersive semiconductor double-chirped mirrors
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- Jasik, A., Dems, M., Wnuk, P. et al. Appl. Phys. B (2014) 116: 141. doi:10.1007/s00340-013-5662-4
We report on the development of semiconductor double-chirped mirrors with the group delay dispersion of −3,800 ± 100 fs2 in the wavelength range between 1,058 ÷ 1,064 nm and reflectivity of 99.1 %. The simplified plane-wave reflection transfer method was used to design the mirror multilayer stack. The mirror contains an epitaxial AlAs/GaAs structure topped with a SiNx antireflective layer.