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Photothermal deflection spectroscopy of polymer thin films

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Abstract

Photothermal Deflection Spectroscopy (PDS) is known to be one of the most sensitive techniques for measuring the absorption of weakly absorbing materials. We have applied PDS for measuring the optical absorption of a few polymer thin-film samples over the wavelength region from 0.4–2.0 μm. The results are useful for optical evaluation of these polymers.

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So, S.K., Chan, M.H. & Leung, L.M. Photothermal deflection spectroscopy of polymer thin films. Appl. Phys. A 61, 159–161 (1995). https://doi.org/10.1007/BF01538383

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  • DOI: https://doi.org/10.1007/BF01538383

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