Article

Zeitschrift für Physik B Condensed Matter

, Volume 72, Issue 4, pp 497-501

Photon emission with the scanning tunneling microscope

  • J. K. GimzewskiAffiliated withIBM Research Division, Zurich Research Laboratory
  • , B. ReihlAffiliated withIBM Research Division, Zurich Research Laboratory
  • , J. H. CoombsAffiliated withIBM Research Division, Zurich Research Laboratory
  • , R. R. SchlittlerAffiliated withIBM Research Division, Zurich Research Laboratory

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Abstract

By placing a photon detector near the tip-sample region of a scanning tunneling microscope, we have measured isochromat photon-emission spectra of polycrystalline tantalum and Si(111)7×7 at photon energies of 9.5 eV. Such spectra contain electronic-structure information comparable to inverse photoemission spectroscopy, but with high lateral/spatial resolution. The implications of this new observation are discussed.