Zeitschrift für Physik B Condensed Matter

, Volume 72, Issue 4, pp 497–501

Photon emission with the scanning tunneling microscope

Authors

  • J. K. Gimzewski
    • IBM Research DivisionZurich Research Laboratory
  • B. Reihl
    • IBM Research DivisionZurich Research Laboratory
  • J. H. Coombs
    • IBM Research DivisionZurich Research Laboratory
  • R. R. Schlittler
    • IBM Research DivisionZurich Research Laboratory
Article

DOI: 10.1007/BF01314531

Cite this article as:
Gimzewski, J.K., Reihl, B., Coombs, J.H. et al. Z. Physik B - Condensed Matter (1988) 72: 497. doi:10.1007/BF01314531

Abstract

By placing a photon detector near the tip-sample region of a scanning tunneling microscope, we have measured isochromat photon-emission spectra of polycrystalline tantalum and Si(111)7×7 at photon energies of 9.5 eV. Such spectra contain electronic-structure information comparable to inverse photoemission spectroscopy, but with high lateral/spatial resolution. The implications of this new observation are discussed.

Copyright information

© Springer-Verlag 1988