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An investigation of electron-photon fluxes after two-layer barriers irradiated by a beam of fast monoenergetic electrons

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Abstract

The dependences of the electron and photon fluxes on the thickness of two-layer barriers irradiated with fast electrons were compared. The results were examined as a source of information about the composition of the absorber, which led to a new method of measuring the thickness of two-layer objects and of determining definitely the layer in which a change of thickness occurs.

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Authors and Affiliations

  1. Scientific-Research Institute of Electron Introscopy affiliated with S. M. Kirov Tomsk Polytechnic Institute, USSR

    V. A. Lisin & N. T. Yunda

  2. Betatron Laboratory, Tomsk Medical Institute, USSR

    V. A. Lisin & N. T. Yunda

Authors
  1. V. A. Lisin
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  2. N. T. Yunda
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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 2, pp. 131–135, February, 1978.

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Lisin, V.A., Yunda, N.T. An investigation of electron-photon fluxes after two-layer barriers irradiated by a beam of fast monoenergetic electrons. Soviet Physics Journal 21, 240–243 (1978). https://doi.org/10.1007/BF00898494

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  • DOI: https://doi.org/10.1007/BF00898494

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