JOM
, Volume 59, Issue 1, pp 12-16
Date: 19 May 2007

Tip dilation and AFM capabilities in the characterization of nanoparticles

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Abstract

Scanning-probe microscopy has been routinely employed as a surface characterization technique for more than 20 years. Tip deconvolution, the longest-standing problem associated with particle image analysis in atomic force microscopy (AFM), can be solved by scanning a pre-characterized nanosphere prior to imaging unknown particles.