Journal of Electronic Materials

, Volume 39, Issue 7, pp 831–836

Foreword

  • S. Sivananthan
  • N. K. Dhar
  • Y. Anter
  • T. N. Casselman
Article

DOI: 10.1007/s11664-010-1259-4

Cite this article as:
Sivananthan, S., Dhar, N.K., Anter, Y. et al. Journal of Elec Materi (2010) 39: 831. doi:10.1007/s11664-010-1259-4
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Copyright information

© TMS 2010

Authors and Affiliations

  • S. Sivananthan
    • 1
  • N. K. Dhar
    • 2
  • Y. Anter
    • 3
  • T. N. Casselman
    • 4
  1. 1.Director, Microphysics LaboratoryUniversity of Illinois at ChicagoChicagoUSA
  2. 2.Defense Advanced Research Projects AgencyArlingtonUSA
  3. 3.Project Coordinator, Microphysics Laboratory, M/C 273University of Illinois at ChicagoChicagoUSA
  4. 4.EPIR Technologies, Inc.BolingbrookUSA