Journal of Electronic Materials

, Volume 39, Issue 7, pp 1087–1096

Molecular Beam Epitaxially Grown HgTe and HgCdTe-on-Silicon for Space-Based X-Ray Calorimetry Applications

Authors

    • EPIR Technologies
  • M. Carmody
    • EPIR Technologies
  • C. H. Grein
    • EPIR Technologies
  • J. Zhao
    • EPIR Technologies
  • R. Bommena
    • EPIR Technologies
  • C. A. Kilbourne
    • NASA Goddard Space Flight Center
  • R. Kelley
    • NASA Goddard Space Flight Center
  • D. McCammon
    • Department of PhysicsUniversity of Wisconsin
  • D. Brandl
    • Department of PhysicsUniversity of Wisconsin
Article

DOI: 10.1007/s11664-010-1249-6

Cite this article as:
Dreiske, P., Carmody, M., Grein, C.H. et al. Journal of Elec Materi (2010) 39: 1087. doi:10.1007/s11664-010-1249-6

Arrays of x-ray microcalorimeters will enable broadband, high-resolution x-ray spectroscopy to study and substantiate black holes, dark matter, and other celestial phenomenon. At EPIR we continue to achieve growth of high-quality, low-doped, single-crystal HgCdTe, and HgTe epilayers on Si and CdZnTe to be employed by NASA in these instruments. Excellent low-temperature heat capacities (with no significant electronic term) have been demonstrated in integrated devices, with both HgTe and HgCdTe showing improvement over the HgTe used previously. Goal resolutions ≤4 eV have been achieved with good yield for both HgTe and HgCdTe.

Keywords

MBEHgCdTeHgTex-raycalorimetrycalorimetersMCT on Sizero-gap HgCdTeCdTeCdZnTe
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© TMS 2010