, Volume 36, Issue 12, pp 1732-1734,
Open Access This content is freely available online to anyone, anywhere at any time.
Date: 19 Sep 2007

Microstructure Development of Mechanical-Deformation-Induced Sn Whiskers

The development of the microstructure of mechanical-deformation-induced Sn whiskers on electroplated films has been examined using a focused ion beam system (FIB). The 6-μm-thick matte Sn films were compressed by using a ZrO2 ball indenter under ambient conditions. After compression, tin whiskers and small nodules were found adjacent to, and several grains further away from, the indents. The cross-sectional microstructures of the indents and whiskers indicate that the lateral boundaries of the newly created grains caused by recrystallization are the main routes for stress relaxation.