Symposium: Neutron and X-Ray Studies of Advanced Materials V

Metallurgical and Materials Transactions A

, Volume 44, Issue 1, pp 68-76

Ultra-Small-Angle X-ray Scattering Instrument at the Advanced Photon Source: History, Recent Development, and Current Status

  • J. IlavskyAffiliated withX-Ray Science Division, Argonne National Laboratory Email author 
  • , F. ZhangAffiliated withMaterial Measurement Laboratory, National Institute of Standards and TechnologyDepartment of Physics, Northern Illinois University
  • , A. J. AllenAffiliated withMaterial Measurement Laboratory, National Institute of Standards and Technology
  • , L. E. LevineAffiliated withMaterial Measurement Laboratory, National Institute of Standards and Technology
  • , P. R. JemianAffiliated withAPS Engineering Support Division, Argonne National Laboratory
  • , G. G. LongAffiliated withX-Ray Science Division, Argonne National LaboratoryMaterial Measurement Laboratory, National Institute of Standards and Technology

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Abstract

The 25-year history and development of an ultra-small-angle X-ray scattering (USAXS) instrument dedicated to serving materials research is presented and discussed. The instrument’s successful track record is attributed to three factors. The first, and surely the most important, is that all development has been driven by scientific research directions and opportunities. Second, the USAXS instrument is a core capability rather than an add-on facility, with measurement capability from micrometers to nanometers, which is precisely the size range where microstructures determine physical properties. The third is that the instrument’s range of capabilities has continually expanded, now including 2D collimation, imaging, and dynamics. And finally, USAXS has enjoyed the benefit of a management structure that has consistently appreciated the unique experimental measurement capabilities that USAXS delivers.