Metallurgical and Materials Transactions A

, Volume 44, Issue 1, pp 68–76

Ultra-Small-Angle X-ray Scattering Instrument at the Advanced Photon Source: History, Recent Development, and Current Status

  • J. Ilavsky
  • F. Zhang
  • A. J. Allen
  • L. E. Levine
  • P. R. Jemian
  • G. G. Long
Symposium: Neutron and X-Ray Studies of Advanced Materials V

DOI: 10.1007/s11661-012-1431-y

Cite this article as:
Ilavsky, J., Zhang, F., Allen, A.J. et al. Metall and Mat Trans A (2013) 44: 68. doi:10.1007/s11661-012-1431-y

Abstract

The 25-year history and development of an ultra-small-angle X-ray scattering (USAXS) instrument dedicated to serving materials research is presented and discussed. The instrument’s successful track record is attributed to three factors. The first, and surely the most important, is that all development has been driven by scientific research directions and opportunities. Second, the USAXS instrument is a core capability rather than an add-on facility, with measurement capability from micrometers to nanometers, which is precisely the size range where microstructures determine physical properties. The third is that the instrument’s range of capabilities has continually expanded, now including 2D collimation, imaging, and dynamics. And finally, USAXS has enjoyed the benefit of a management structure that has consistently appreciated the unique experimental measurement capabilities that USAXS delivers.

Copyright information

© The Minerals, Metals & Materials Society and ASM International 2012

Authors and Affiliations

  • J. Ilavsky
    • 1
  • F. Zhang
    • 2
    • 3
  • A. J. Allen
    • 2
  • L. E. Levine
    • 2
  • P. R. Jemian
    • 4
  • G. G. Long
    • 1
    • 2
  1. 1.X-Ray Science DivisionArgonne National LaboratoryArgonneUSA
  2. 2.Material Measurement LaboratoryNational Institute of Standards and TechnologyGaithersburgUSA
  3. 3.Department of PhysicsNorthern Illinois UniversityDeKalbUSA
  4. 4.APS Engineering Support DivisionArgonne National LaboratoryArgonneUSA