, Volume 39, Issue 4, pp 934-944
Date: 12 Feb 2008

Deformation Twinning and the Hall–Petch Relation in Commercial Purity Ti

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The effect of grain size and deformation temperature on the behavior of wire-drawn α-Ti during compression has been examined. At strains of 0.3, the flow stress exhibited a negative Hall–Petch slope. This is proposed to result from the prevalence of twinning during the compressive deformation. Electron backscattered diffraction revealed that \( \{ 10\ifmmode\expandafter\bar\else\expandafter\=\fi{1}2\} \) was the most prolific twin type across all the deformation temperatures and grain sizes examined. Of the twinning modes observed, \( \{ 11\ifmmode\expandafter\bar\else\expandafter\=\fi{2}2\} \) twinning was the most sensitive to the grain size and deformation temperature. The range of morphologies exhibited by deformation twins is also described.

Manuscript submitted June 26, 2007.