Journal of Nanoparticle Research

, Volume 13, Issue 1, pp 1–13

General approach for fabricating nanoparticle arrays via patterned block copolymer nanoreactors

Authors

  • Xihong Zu
    • School of Chemistry and Chemical EngineeringSouth China University of Technology
    • School of Chemical and Biomolecular EngineeringGeorgia Institute of Technology
  • Weiping Tu
    • School of Chemistry and Chemical EngineeringSouth China University of Technology
    • School of Chemical and Biomolecular EngineeringGeorgia Institute of Technology
Research Paper

DOI: 10.1007/s11051-010-0059-3

Cite this article as:
Zu, X., Tu, W. & Deng, Y. J Nanopart Res (2011) 13: 1. doi:10.1007/s11051-010-0059-3

Abstract

A general approach to fabricate nanoparticle arrays of different kinds of materials is demonstrated in this paper. It was found that the center-to-center distance of the nanoparticles or the nanoclusters can be controlled using patterned block copolymer nanoreactors by adding polystyrene (PS) homopolymer to poly(styrene-b-4-vinylpyridine) (PS-b-P4VP) diblock copolymer thin film. The number of the nanoparticles formed in the P4VP nanodomains can also be adjusted by addition of polystyrene (PS) homopolymer to poly(styrene-b-4-vinylpyridine) (PS-b-P4VP) diblock copolymer. In fabrication of Au nanoparticle arrays, HAuCl4 precursor was directly loaded into P4VP nanodomains of the diblock copolymer thin film by using a methanol solvent, which is a good solvent for P4VP but non-solvent for PS. The Au nanoparticle arrays were then obtained by reducing HAuCl4 with sodium citrate dihydrate, and then in situ transferred to silicon substrate by a two-step calcination method. ZnO and FexOy nanoparticle arrays were also synthesized by this approach with thermal decomposition and double decomposition reactions, respectively. Additionally, the advantage of using two-step calcination method over the air plasma method was discussed.

Keywords

Nanoparticle arrayBlock copolymerNanoreactorPatterningNanomanufacturing

Copyright information

© Springer Science+Business Media B.V. 2010