, Volume 65, Issue 2, pp 130-134

Sol–gel processed indium zinc oxide thin film and transparent thin-film transistors

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Abstract

Indium–zinc oxide (IZO) thin films were fabricated by spin coating using acetate- and nitrate-based precursors, and thin film transistors (TFTs) were further fabricated employing the IZO films as the active channel layer. The impact of the indium concentration on the properties of the solutions, the structure and optical transmittance properties of the IZO films and the IZO TFTs device properties were researched in this article. The IZO films with amorphous structure were obtained when the annealing temperature is 500 °C. The transmittance could reach ~90 % (including glass substrate) during the visible region of 400–760 nm. Higher indium concentration can improve the IZO TFTs’ filed effect mobility. A Ion–Ioff of 6.0 × 106 and a mobility of 0.13 cm2/Vs were obtained when the indium concentration is 60 %. IZO TFTs’ performance could deteriorate when the indium concentration more than 60 %.