, Volume 18, Issue 4, pp 537-540
Date: 27 Jul 2005

Epitaxial Growth of CeO2/YSZ/CeO2 Buffer Layers on Textured Ni Substrates for YBCO Conductors

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CeO2/YSZ/CeO2 buffer layers were deposited on textured Ni substrates by in situ pulsed laser deposition. The out-of-plane texture and in-plane texture of the buffer layers were characterized by X-ray diffraction ω-scans and ϕ-scans. Using this CeO2/YSZ/CeO2 architecture as the buffer layers, high quality YBCO films with a zero-resistance T c about 90 K and a self-field critical current densities J c above 106 A/cm2 at 77 K can be obtained on Ni substrates.