Journal of Low Temperature Physics

, Volume 163, Issue 3, pp 164–169

Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions

Authors

    • Low Temperature LaboratoryAalto University
  • S. Gasparinetti
    • Low Temperature LaboratoryAalto University
  • M. Möttönen
    • Low Temperature LaboratoryAalto University
    • Department of Applied Physics/COMPAalto University
  • J. P. Pekola
    • Low Temperature LaboratoryAalto University
Article

DOI: 10.1007/s10909-011-0344-2

Cite this article as:
Yoon, Y., Gasparinetti, S., Möttönen, M. et al. J Low Temp Phys (2011) 163: 164. doi:10.1007/s10909-011-0344-2

Abstract

We have studied experimentally the escape dynamics in underdamped capacitively shunted and unshunted Josephson junctions with submicroampere critical currents below 0.5 K temperatures. In the shunted junctions, thermal activation process was preserved up to the highest temperature where the escape in the unshunted junctions exhibits the phase diffusion. Our observations in the shunted junctions are in good agreement with the standard thermal activation escape, unlike the results in the unshunted junctions.

Keywords

Josephson junction Phase diffusion Thermal activation

Copyright information

© Springer Science+Business Media, LLC 2011