Abstract
Bulk and quantum well GaAs1−xBix/GaAs layers with Bi mole fractions from 0.02 to 0.10 are grown by molecular-beam epitaxy at temperatures ranging from 280 to 320 °C. The samples are characterized using temperature and pump-power dependent photoluminescence measurements covering 8–300 K and 1–250 mW (7–1,800 W/cm2), respectively. The results indicate that there is strong reduction in bandgap energy with the incorporation of small amounts of Bi and that GaAsBi most likely forms a weak type-I band alignment with GaAs.
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Acknowledgments
We gratefully acknowledge financial support through the National Science Foundation award DMR-0909028, the Natural Sciences and Engineering Research Council of Canada, the Deutsche Forschungsgemeinschaft (German Research Foundation), and the Materials World Network: III–V Bismide Materials for IR and Mid IR Semiconductors.
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Riordan, N.A., Gogineni, C., Johnson, S.R. et al. Temperature and pump power dependent photoluminescence characterization of MBE grown GaAsBi on GaAs. J Mater Sci: Mater Electron 23, 1799–1804 (2012). https://doi.org/10.1007/s10854-012-0665-1
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DOI: https://doi.org/10.1007/s10854-012-0665-1