Journal of Materials Science: Materials in Electronics

, Volume 17, Issue 12, pp 1065–1070

Planar defects and phase transformation in ZnSe nanosaws

  • Y. Q. Wang
  • U. Philipose
  • H. Ruda
  • K. L. Kavanagh
Article

DOI: 10.1007/s10854-006-9006-6

Cite this article as:
Wang, Y.Q., Philipose, U., Ruda, H. et al. J Mater Sci: Mater Electron (2006) 17: 1065. doi:10.1007/s10854-006-9006-6
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Abstract

ZnSe nanostructures were grown on Si substrates by Au catalyzed vapor phase growth at 725°C. Three different types of ZnSe nanosaws have been observed using transmission electron microscopy (TEM). Detailed structural and microstructural investigation has been carried out using electron diffraction and high-resolution TEM (HRTEM). It has been found that stacking faults and phase transformation are important features of the nanosaw formation. The controlled formation of these ZnSe nanosaws could have very important device applications.

Copyright information

© Springer Science+Business Media, LLC 2006

Authors and Affiliations

  • Y. Q. Wang
    • 1
  • U. Philipose
    • 2
  • H. Ruda
    • 2
  • K. L. Kavanagh
    • 1
  1. 1.Department of PhysicsSimon Fraser UniversityBurnabyCanada
  2. 2.Center for Advanced NanotechnologyUniversity of TorontoTorontoCanada