, Volume 28, Issue 6, pp 775-776
Date: 16 Nov 2012

Test Technology Newsletter

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8th IEEE International Workshop on Silicon Debug and Diagnosis - SDD 2012

8-9 November, 2012, Anaheim, California, USA


Troubleshooting how and why systems and circuits fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for R&D, or just getting a working first prototype. This detective work is however very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time-to-market. New and efficient solutions for debug and diagnosis have a much needed and highly visible impact on productivity.

SDD 2012 will be held in Anaheim, California, USA. It is the eighth of a series of highly successful technical workshops that consider issues related to debug & diagnosis of semiconductor circuits and systems - from proto ...