Journal of Electronic Testing

, Volume 23, Issue 6, pp 497–512

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis

  • T. R. Balen
  • J. V. Calvano
  • M. S. Lubaszewski
  • M. Renovell
Article

DOI: 10.1007/s10836-007-5004-8

Cite this article as:
Balen, T.R., Calvano, J.V., Lubaszewski, M.S. et al. J Electron Test (2007) 23: 497. doi:10.1007/s10836-007-5004-8
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Abstract

In this work a strategy for testing analog networks, known as Transient Response Analysis Method, is applied to test the Configurable Analog Blocks (CABs) of Field Programmable Analog Arrays (FPAAs). In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks to known input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between fault-free and faulty CABs. Two FPAAs from different manufacturers and distinct architectures are considered as CUT. For one of the devices there is no detailed information about its structural implementation. For this reason, a functional fault model based on high-level parameters of the transfer function of the programmed blocks is adopted, and then, the relationship between these parameters and CAB component deviations is investigated. The other considered device allows a structural programming in which the designer can directly modify the values of programmable components. This way, faults can be injected by modifying the values of these components in order to emulate a defective behavior. Therefore, it is possible to estimate the fault coverage and test application time of the proposed functional test method when applied to both considered devices.

Keywords

FPAAAnalog built-in self-testTransient response analysis

Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  • T. R. Balen
    • 1
  • J. V. Calvano
    • 2
  • M. S. Lubaszewski
    • 1
  • M. Renovell
    • 3
  1. 1.Departamento de Engenharia ElétricaUniversidade Federal do Rio Grande do SulPorto AlegreBrazil
  2. 2.Instituto de Pesquisas da Marinha do BrasilRio de JaneiroBrazil
  3. 3.LIRMM-Université de Montpellier IIMontpelierFrance