Journal of Electronic Testing

, Volume 21, Issue 2, pp 135–146

Applying the Oscillation Test Strategy to FPAA’s Configurable Analog Blocks

  • Tiago R. Balen
  • Antonio Q. AndradeJr.
  • Florence AzaÏs
  • Marcelo Lubaszewski
  • Michel Renovell
Article

DOI: 10.1007/s10836-005-6143-4

Cite this article as:
Balen, T.R., Andrade, A.Q., AzaÏs, F. et al. J Electron Test (2005) 21: 135. doi:10.1007/s10836-005-6143-4

Abstract

This paper presents the application of the oscillation test methodology as an alternative to test configurable analog blocks of Field Programmable Analog Arrays. The blocks of the device under test are first configured to behave as oscillators. Then, the output frequency and amplitude are observed to obtain the signature of the fault-free circuit. During test, this signature is compared to the actual output signal. Experimental results show the effectiveness of the method in detecting parametric and large deviation faults of the tested components.

Keywords

analog testing FPAA test Oscillation Test Strategy (OTS) Built-In Self Test (BIST) 

Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  • Tiago R. Balen
    • 1
  • Antonio Q. AndradeJr.
    • 1
  • Florence AzaÏs
    • 2
  • Marcelo Lubaszewski
    • 1
  • Michel Renovell
    • 2
  1. 1.Departamento de Engenharia ElétricaUniversidade Federal do Rio Grande do SulPorto AlegreBrazil
  2. 2.LIRMMUniversité de Montpellier II: Sciences et Techniques du LanguedocMontpellier Cedex 5France

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