Experimental Astronomy

, Volume 20, Issue 1, pp 299–306

Development of ground-testable phase fresnel lenses in silicon

Authors

    • Universities Space Research Association
    • NASA Goddard Space Flight Center
  • Brian Morgan
    • Dept. of Electrical and Computer EngineeringUniversity of Maryland
  • Robert Streitmatter
    • NASA Goddard Space Flight Center
  • Neil Gehrels
    • NASA Goddard Space Flight Center
  • Keith Gendreau
    • NASA Goddard Space Flight Center
  • Zaven Arzoumanian
    • Universities Space Research Association
    • NASA Goddard Space Flight Center
  • Reza Ghodssi
    • Dept. of Electrical and Computer EngineeringUniversity of Maryland
  • Gerry Skinner
    • CESR
Original Article

DOI: 10.1007/s10686-006-9030-9

Cite this article as:
Krizmanic, J., Morgan, B., Streitmatter, R. et al. Exp Astron (2005) 20: 299. doi:10.1007/s10686-006-9030-9

Abstract

Diffractive optics, such as Phase Fresnel Lenses (PFL's), offer the potential to achieve excellent imaging performance in the x-ray and gamma-ray photon regimes. In principle, the angular resolution obtained with these devices can be diffraction limited. Furthermore, improvements in signal sensitivity can be achieved as virtually the entire flux incident on a lens can be concentrated onto a small detector area. In order to verify experimentally the imaging performance, we have fabricated PFL's in silicon using gray-scale lithography to produce the required Fresnel profile. These devices are to be evaluated in the recently constructed 600-meter x-ray interferometry testbed at NASA/GSFC. Profile measurements of the Fresnel structures in fabricated PFL's have been performed and have been used to obtain initial characterization of the expected PFL imaging efficiencies.

Keywords

X-ray astronomyGamma-ray astronomyOptics

Copyright information

© Springer Science+Business Media B.V. 2006