Neurological Sciences

, Volume 29, Issue 6, pp 435–444

Evaluating sub-clinical cognitive dysfunction and event-related potentials (P300) in clinically isolated syndrome

Authors

    • Department of NeurologyGazi University Medical Faculty
  • Tugba Unal
    • Department of NeurologyGazi University Medical Faculty
  • Bijen Nazliel
    • Department of NeurologyGazi University Medical Faculty
  • Zeynep Biyikli
    • Department of BiostatisticsAnkara University Medical Faculty
  • Zulal Yesilbudak
    • Department of NeurologyGazi University Medical Faculty
  • Sirel Karakas
    • Department of Experimental PsychologyHacettepe University
  • Ceyla Irkec
    • Department of NeurologyGazi University Medical Faculty
Original Article

DOI: 10.1007/s10072-008-1020-4

Cite this article as:
Kocer, B., Unal, T., Nazliel, B. et al. Neurol Sci (2008) 29: 435. doi:10.1007/s10072-008-1020-4

Abstract

Objective

This study investigated the presence of sub-clinical cognitive dysfunction in patients with clinically isolated syndrome (CIS) and the abnormalities of cognitive event-related potentials (ERPs).

Methods

Subclinical cognitive dysfunction was assessed in 20 patients with CIS and in 20 healthy controls.

Results

Patients had impairments in verbal learning and long-term memory, evaluating attention, executive function and visuospatial skills, in decreasing order of frequency. SDLT and SIT were the most, and COWAT and BNT were the least affected tests. The N200 and P200 latencies were prolonged, and N100, N200 and P200 amplitudes were reduced in the patients relative to the controls, from the Fz, Cz and Pz electrode positions (p<0.05).

Conclusion

Detailed cognitive testing is valuable in determining subclinical cognitive dysfunction in CIS patients. ERP abnormalities as well as abnormalities in detailed cognitivetesting in patients with CIS are helpful in the diagnosis of sub-clinical cognitive dysfunction.

Keywords

Clinically isolated syndromesCognitive dysfunctionEvent-related potentials (P300)Multiple sclerosis
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Copyright information

© Springer-Verlag Italia 2008