Optical Review

, Volume 4, Issue 3, pp 429–432

Automatic Deformation Analysis in Electronic Speckle Pattern Interferometry Using One Speckle Interferogram of Deformed Object

OPTICAL SYSTEMS AND TECHNOLOGIES

DOI: 10.1007/s10043-997-0429-y

Cite this article as:
Adachi, M., Ueyama, Y. & Inabe, K. OPT REV (1997) 4: 429. doi:10.1007/s10043-997-0429-y

Abstract

We propose a new fringe analysis method that uses only one speckle interferogram of a deformed object to obtain phase change distribution by deformation. This method uses cos-1 operations to extract absolute, not signed, values of new phase after deformation. Considering the phase changes in a small local area, true phase changes retain almost the same value by assuming a continuous deformation in the area. This retention determines the sign of the new phase. From the new phase and the initial phase, the phase change distribution by the deformation can be obtained. Experimental results show the usefulness of this method.

Key words

electronic speckle pattern interferometry deformation arccosine operation phase change distribution automatic analysis 

Copyright information

© The Optical Society of Japan 1997

Authors and Affiliations

  1. 1.Faculty of EngineeringKanazawa UniversityKanazawaJapan