Optical Review

, Volume 16, Issue 4, pp 472–475

Fast acquisition of reflectance spectra using wide spectral lines

Authors

    • Department of PhysicsUniversity of Kuopio
  • Victor Teplov
    • Department of PhysicsUniversity of Kuopio
  • Ervin Nippolainen
    • Department of PhysicsUniversity of Kuopio
  • Alexei A. Kamshilin
    • Department of PhysicsUniversity of Kuopio
Regular Papers

DOI: 10.1007/s10043-009-0091-7

Cite this article as:
Fauch, L., Teplov, V., Nippolainen, E. et al. OPT REV (2009) 16: 472. doi:10.1007/s10043-009-0091-7

Abstract

We analyze a recently proposed technique for fast acquisition of the two-dimensional (2D) spatial distribution of reflectance spectra to figure out how much its ability of distinguishing almost similar spectra declines with increase of the spectral line bandwidth of the light source. This analysis was carried out using the experimentally measured reflectance spectra of four metameric samples and simulating the system response to an illumination by spectral lines with variable bandwidth. It was shown that the metameric samples are distinguishable even when the bandwidth of illuminating lines is 20–30 nm. A wider bandwidth allows implementation of simultaneous illumination of an object that leads to a diminution of the acquisition time of 2D-multispectral images due to both faster operation in the parallel mode of Light-emitting diodes (LEDs) switching and higher output power.

Keywords

multispectral imaginglight sourcereflectance spectrumprincipal component analysisdata acquisition
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Copyright information

© The Optical Society of Japan 2009