Special Section: The 5th Asia-Pacific Conference on Near-Field Optics
Cite this article as:
Kirihara, A., Kono, S., Tomita, A. et al. OPT REV (2006) 13: 279. doi:10.1007/s10043-006-0279-z
We report on the development of a cantilever-based scanning near-field optical microscope (SNOM) working in an extreme environment, at cryogenic temperature around 10 K and under strong magnetic field up to 7 T. We designed a new optical system based on an infinite conjugate microscope, which extracts the near-field signal from a small aperture through a narrow chamber into free space as collimated light. Using this system, we successfully measured near-field and topographical images of a metal-hole sample simultaneously. Combining the local optical accessing technique with the external control of the electronic state, this SNOM system will be a powerful tool to study optical properties of semiconductor nanostructures.