LASERS

Optical Review

, Volume 9, Issue 5, pp 186-188

Reflection Induced Voltage Change of Surface Emitting Laser for Optical Probing

  • Jiro HashizumeAffiliated withMicrosystem Research Center, P&I Lab., Tokyo Institute of Technology Email author 
  • , Satoshi ShinadaAffiliated withMicrosystem Research Center, P&I Lab., Tokyo Institute of Technology
  • , Fumio KoyamaAffiliated withMicrosystem Research Center, P&I Lab., Tokyo Institute of Technology
  • , Kenichi IgaAffiliated withMicrosystem Research Center, P&I Lab., Tokyo Institute of TechnologyJapan Society for the Promotion of Science/Kogakuin University

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Abstract

We demonstrate a novel optical probing technique using the reflection-induced change in voltage of a GaAs vertical cavity surface emitting laser (VCSEL). We present the modeling and experiment of the VCSEL based probing. A two-dimensional image probing is successfully demonstrated.

Key words

VCSEL reflection voltage change optical storage contact head