Optical Review

, Volume 8, Issue 1, pp 59–63

Surface Shape Measurement by Wavelength Scanning Interferometry Using an Electronically Tuned Ti:sapphire Laser

  • Akihiro Yamamoto
  • Chih-Che Kuo
  • Kei Sunouchi
  • Satoshi Wada
  • Ichirou Yamaguchi
  • Hideo Tashiro
OPTICAL SYSTEMS AND TECHNOLOGIES

DOI: 10.1007/s10043-001-0059-8

Cite this article as:
Yamamoto, A., Kuo, C., Sunouchi, K. et al. OPT REV (2001) 8: 59. doi:10.1007/s10043-001-0059-8

Abstract

We developed a high speed and high resolution surface shape measurement system based on wavelength scanning interferometry with an electronically tuned Ti:sapphire laser. This laser emits pulses and the wavelength of each pulse can be tuned arbitrarily within 680 nm and 1056 nm. We also designed a high speed multiport CCD camera as a detector. This camera is synchronized with wavelength scanning of the laser at the frequency of 250 Hz. We could measure the object shape with a height resolution of 3.05 μm at the tuning range from 740.0 nm to 842.3 nm. By simple parabolic curve fitting to the Fourier peak of interference signals from each CCD pixel, the height resolution has been improved to the order of submicrometers.

Key words

profilometrywavelength scanning interferometrytunable laserhigh speed CCD cameraimage processing

Copyright information

© The Optical Society of Japan 2001

Authors and Affiliations

  • Akihiro Yamamoto
    • 1
    • 2
  • Chih-Che Kuo
    • 2
  • Kei Sunouchi
    • 2
  • Satoshi Wada
    • 2
  • Ichirou Yamaguchi
    • 1
    • 2
  • Hideo Tashiro
    • 2
  1. 1.Optical Engineering LaboratoryWako, SaitamaJapan
  2. 2.3DFD Development teamRIKEN (The Institute of Physical and Chemical Research)Wako, SaitamaJapan