Journal of Solid State Electrochemistry

, Volume 8, Issue 10, pp 683–692

Application of AC impedance techniques to Scanning Electrochemical Microscopy

Authors

    • Department of ChemistryUniversity of Saskatchewan
  • Piotr M. Diakowski
    • Department of ChemistryUniversity of Saskatchewan
Original Paper

DOI: 10.1007/s10008-004-0533-x

Cite this article as:
Baranski, A.S. & Diakowski, P.M. J Solid State Electrochem (2004) 8: 683. doi:10.1007/s10008-004-0533-x

Abstract

Fundamental aspects of alternating current Scanning Electrochemical Microscopy (AC-SECM) have been studied. In particular, the flow of AC currents in the cell and simplified equivalent circuit diagrams are discussed. In the case of conductive substrates, the local (1st and 2nd order) impedance characteristic of the substrate is presented as a function of DC potential. 3-D imaging of mixed substrates (containing both conductive and non-conductive areas) was performed in the supporting electrolyte alone, without an added redox mediator.

Keywords

Scanning electrochemical microscopy AC-SECM 2nd order impedance 2nd harmonic AC voltammetry

Copyright information

© Springer-Verlag 2004